Nitrogen adsorption data, FIB-SEM tomography and TEM micrographs of neutron-irradiated superfine grain graphite
This manuscript provides raw nitrogen gas adsorption data, images and videos obtained from a technique that combines Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) known as FIB-SEM tomography and Transmission Electron Microscopy (TEM) micrographs. This collection of data is useful for...
| Հիմնական հեղինակներ: | , , , , , , , |
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| Ձևաչափ: | Հոդված |
| Լեզու: | English |
| Հրապարակվել է: |
Elsevier
2018-12-01
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| Շարք: | Data in Brief |
| Առցանց հասանելիություն: | http://www.sciencedirect.com/science/article/pii/S2352340918314719 |