Application of Advanced Deep Learning Models for Efficient Apple Defect Detection and Quality Grading in Agricultural Production

Application of Advanced Deep Learning Models for Efficient Apple Defect Detection and Quality Grading in Agricultural Production

In this study, a deep learning-based system for apple defect detection and quality grading was developed, integrating various advanced image-processing technologies and machine learning algorithms to enhance the automation and accuracy of apple quality monitoring. Experimental validation demonstrate...

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Bibliographic Details
Main Authors: Xiaotong Gao, Songwei Li, Xiaotong Su, Yan Li, Lingyun Huang, Weidong Tang, Yuanchen Zhang, Min Dong
Format: Article
Language:English
Published: MDPI AG 2024-07-01
Series:Agriculture
Subjects:
advanced image processing
Segment Anything Model
apple quality grading
apple defect detection
deep learning in agriculture
Online Access:https://www.mdpi.com/2077-0472/14/7/1098

Internet

https://www.mdpi.com/2077-0472/14/7/1098

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