A multi-point calibration method for electron probe microanalysis (EPMA) of indium in sphalerite (ZnS)
Abstract This article presents a multi-point calibration approach for electron probe microanalysis (EPMA) for the trace element analysis of indium in sphalerite (ZnS). To define a multi-point calibration curve, indium and cadmium-doped ZnS crystals in a concentration range from 0 (blank) to ~ 1500 µ...
| প্রধান লেখক: | , |
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| বিন্যাস: | প্রবন্ধ |
| ভাষা: | English |
| প্রকাশিত: |
Nature Portfolio
2025-03-01
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| মালা: | Scientific Reports |
| বিষয়গুলি: | |
| অনলাইন ব্যবহার করুন: | https://doi.org/10.1038/s41598-025-91085-x |