Dissipation processes in superconducting NbN nanostructures

In this paper, we present a comprehensive study of electrical transport measurements on a superconducting film of NbN (thickness, d ∼ 50 nm) and its nanostructures fabricated using Focused Ion Beam (FIB) in the form of one bridge (width, w ∼ 50 µm) and three meanders (w ∼ 500 nm, 250 nm, and 100 nm)...

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Bibliographic Details
Main Authors: Lalit M. Joshi, P. K. Rout, Sudhir Husale, Anurag Gupta
Format: Article
Language:English
Published: AIP Publishing LLC 2020-11-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/5.0021428