Crystal-Based X-ray Interferometry and Its Application to Phase-Contrast X-ray Imaging, Z<sub>eff</sub> Imaging, and X-ray Thermography

Crystal-Based X-ray Interferometry and Its Application to Phase-Contrast X-ray Imaging, Z<sub>eff</sub> Imaging, and X-ray Thermography

Crystal-based X-ray interferometry (CXI) detects X-ray phase shifts by using the superposition of waves, and its sensitivity is the highest among the other X-ray phase-detecting methods. Therefore, phase-contrast X-ray imaging (PCXI) using CXI has the highest density resolution among the PCXI method...

Full description

Bibliographic Details
Main Authors: Akio Yoneyama, Daiko Takamatsu, Thet-Thet Lwin, Shigehito Yamada, Tetsuya Takakuwa, Kazuyuki Hyodo, Keiichi Hirano, Satoshi Takeya
Format: Article
Language:English
Published: MDPI AG 2023-04-01
Series:Applied Sciences
Subjects:
X-rays
crystal-based X-ray interferometer
phase-contrast X-ray imaging
synchrotron radiation
Online Access:https://www.mdpi.com/2076-3417/13/9/5424

Internet

https://www.mdpi.com/2076-3417/13/9/5424

Similar Items