Leaf Recognition Based on Elliptical Half Gabor and Maximum Gap Local Line Direction Pattern
Plant identification via leaf images is very meaningful to agricultural information. The existing methods were based on one or two kinds of the three distinct characteristics in leaf images including leaf contours, textures and veins. This limits their recognition performance and scope of applicatio...
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
|
| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9007701/ |