BPath-RO: A Performance- and Area-Efficient In Situ Delay Measurement Scheme for Digital IC

BPath-RO: A Performance- and Area-Efficient In Situ Delay Measurement Scheme for Digital IC

Circuit delays are increasingly sensitive to process, voltage, temperature, and aging (PVTA) variations, severely impacting circuit performance. Accurate measurement of circuit delay is essential. However, the additional hardware structures for measuring circuit delay add to the critical path delay....

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Bibliographic Details
Main Authors: Danqing Li, Huaguo Liang, Hong Zhang, Yue Wang, Maoxiang Yi, Yingchun Lu, Zhengfeng Huang
Format: Article
Language:English
Published: MDPI AG 2023-11-01
Series:Electronics
Subjects:
bypass
delay measurement
in situ
ring oscillators
process
voltage
Online Access:https://www.mdpi.com/2079-9292/12/23/4853

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https://www.mdpi.com/2079-9292/12/23/4853

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