A Universal Spring-Probe System for Reliable Probing of Electrochemical Lab-on-a-Chip Devices

A Universal Spring-Probe System for Reliable Probing of Electrochemical Lab-on-a-Chip Devices

For achieve sensitivity in lab-on-a-chip electrochemical detection, more reliable probing methods are required, especially for repeated measurements. Spring-probes are a promising candidate method which can replace needle-like probes and alligator clips that usually produce scratches on the surface...

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Bibliographic Details
Main Authors: Moon-Keun Lee, Tae Jae Lee, Ho Woon Choi, Su Jeong Shin, Jung Youn Park, Seok Jae Lee
Format: Article
Language:English
Published: MDPI AG 2014-01-01
Series:Sensors
Subjects:
spring-probe
reliability
probing system
electrochemical measurement
lab-on-a-chip
Online Access:http://www.mdpi.com/1424-8220/14/1/944

Internet

http://www.mdpi.com/1424-8220/14/1/944

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