Origin of giant electric-field-induced strain in faulted alkali niobate films

Origin of giant electric-field-induced strain in faulted alkali niobate films

Maximizing the electromechanical response is crucial for developing piezoelectric devices. Here, the authors demonstrate a giant electric-field-induced strain and its origin in alkali niobate epitaxial thin films with self-assembled planar faults.

Bibliographic Details
Main Authors: Moaz Waqar, Haijun Wu, Khuong Phuong Ong, Huajun Liu, Changjian Li, Ping Yang, Wenjie Zang, Weng Heng Liew, Caozheng Diao, Shibo Xi, David J. Singh, Qian He, Kui Yao, Stephen J. Pennycook, John Wang
Format: Article
Language:English
Published: Nature Portfolio 2022-07-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-022-31630-8

Internet

https://doi.org/10.1038/s41467-022-31630-8

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