Measurement of Waveplate Parameters over Entire Clear Aperture Based on Differential Frequency Modulation with Dual Photoelastic Modulators

To obtain highly sensitive, accurate, fast, and repeatable measurements of waveplate parameters over an entire clear aperture, a novel measurement method using dual differential frequency photoelastic modulations is proposed. Simple polarimetry is conducted based on two photoelastic modulators, whic...

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Bibliographic Details
Main Authors: Kewu Li, Shuang Wang, Zhibin Wang
Format: Article
Language:English
Published: MDPI AG 2023-04-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/13/7/4496