Interface-induced transverse resistivity anomaly in AgNbO3/SrRuO3 heterostructures
The transverse resistivity anomaly with a hump feature, associated with topological magnetic textures, is of paramount importance for the applications of next-generation chiral spintronic devices. However, the origin of the hump feature still remains debated due to the complicated mechanism, not mer...
Main Authors: | , , , , , , , , , |
---|---|
Format: | Article |
Language: | English |
Published: |
AIP Publishing LLC
2024-02-01
|
Series: | APL Materials |
Online Access: | http://dx.doi.org/10.1063/5.0192702 |