Current challenges and solutions of super-resolution structured illumination microscopy
The resolution of fluorescence microscopy is limited by the diffraction imaging system, and many methods have been proposed to overcome the optical diffraction limit for achieving super-resolution imaging. Structured illumination microscopy (SIM) is one of the most comp...
| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2021-02-01
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| Series: | APL Photonics |
| Online Access: | http://dx.doi.org/10.1063/5.0038065 |