Effects of surface passivation dielectrics on carrier transport in AlGaN/GaN heterostructure field-effect transistors

Dielectric layers prepared by different deposition methods were used for the surface passivation of AlGaN/GaN heterostructure field-effect transistors (HFETs) and the corresponding electrical characteristics were examined. Increases in the sheet charge density and the maximum drain current by approx...

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Bibliographic Details
Main Authors: Sejoon Oh, Han-Soo Jang, Chel-Jong Choi, Jaehee Cho
Format: Article
Language:English
Published: AIP Publishing LLC 2018-04-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.5027634