Correction: Switching performance assessment of gate-all-around InAs–Si vertical TFET with triple metal gate, a simulation study
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Springer
2024-02-01
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| Series: | Discover Nano |
| Online Access: | https://doi.org/10.1186/s11671-024-03968-z |
| _version_ | 1797273524018085888 |
|---|---|
| author | Dariush Madadi Saeed Mohammadi |
| author_facet | Dariush Madadi Saeed Mohammadi |
| author_sort | Dariush Madadi |
| collection | DOAJ |
| first_indexed | 2024-03-07T14:45:36Z |
| format | Article |
| id | doaj.art-51b40fbf4fee4bc49a4be67bb6aa987b |
| institution | Directory Open Access Journal |
| issn | 2731-9229 |
| language | English |
| last_indexed | 2024-03-07T14:45:36Z |
| publishDate | 2024-02-01 |
| publisher | Springer |
| record_format | Article |
| series | Discover Nano |
| spelling | doaj.art-51b40fbf4fee4bc49a4be67bb6aa987b2024-03-05T20:02:05ZengSpringerDiscover Nano2731-92292024-02-011911110.1186/s11671-024-03968-zCorrection: Switching performance assessment of gate-all-around InAs–Si vertical TFET with triple metal gate, a simulation studyDariush Madadi0Saeed Mohammadi1Department of Engineering Sciences, Faculty of Technology and Engineering, Semnan UniversityDepartment of Electrical and Computer Engineering, Semnan Universityhttps://doi.org/10.1186/s11671-024-03968-z |
| spellingShingle | Dariush Madadi Saeed Mohammadi Correction: Switching performance assessment of gate-all-around InAs–Si vertical TFET with triple metal gate, a simulation study Discover Nano |
| title | Correction: Switching performance assessment of gate-all-around InAs–Si vertical TFET with triple metal gate, a simulation study |
| title_full | Correction: Switching performance assessment of gate-all-around InAs–Si vertical TFET with triple metal gate, a simulation study |
| title_fullStr | Correction: Switching performance assessment of gate-all-around InAs–Si vertical TFET with triple metal gate, a simulation study |
| title_full_unstemmed | Correction: Switching performance assessment of gate-all-around InAs–Si vertical TFET with triple metal gate, a simulation study |
| title_short | Correction: Switching performance assessment of gate-all-around InAs–Si vertical TFET with triple metal gate, a simulation study |
| title_sort | correction switching performance assessment of gate all around inas si vertical tfet with triple metal gate a simulation study |
| url | https://doi.org/10.1186/s11671-024-03968-z |
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