Expanding the Angle of Incidence Tolerance of Unclonable Anticounterfeiting Labels Based on Microlens Arrays and Luminescent Microparticles

Expanding the Angle of Incidence Tolerance of Unclonable Anticounterfeiting Labels Based on Microlens Arrays and Luminescent Microparticles

Unclonable anticounterfeiting labels can be based on micrometer‐scale randomness created by stochastic processes like the distribution of luminescent microparticles in a transparent layer. Adding a microlens array to the layer can simplify the hardware needed for authentication in that magnification...

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Bibliographic Details
Main Authors: Vinay Kumar, Stephan Dottermusch, Aditya Chauhan, Bryce S. Richards, Ian A. Howard
Format: Article
Language:English
Published: Wiley-VCH 2022-06-01
Series:Advanced Photonics Research
Subjects:
anticounterfeiting
microlens arrays
unclonable labels
Online Access:https://doi.org/10.1002/adpr.202100202

Internet

https://doi.org/10.1002/adpr.202100202

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