New genomic regions associated with white mold resistance in dry bean using a MAGIC population

Abstract Dry bean (Phaseolus vulgaris L.) production in many regions is threatened by white mold (WM) [Sclerotinia sclerotiorum (Lib.) de Bary]. Seed yield losses can be up to 100% under conditions favorable for the pathogen. The low heritability, polygenic inheritance, and cumbersome screening prot...

Full description

Bibliographic Details
Main Authors: Edgar Escobar, Atena Oladzad, Kristin Simons, Phillip Miklas, Rian K. Lee, Stephan Schroder, Nonoy Bandillo, Michael Wunsch, Phillip E. McClean, Juan M. Osorno
Format: Article
Language:English
Published: Wiley 2022-03-01
Series:The Plant Genome
Online Access:https://doi.org/10.1002/tpg2.20190