EMI Susceptibility of the Output Pin in CMOS Amplifiers
Measurements in commercial devices demonstrate a considerable susceptibility of the operational amplifiers to the electromagnetic interferences coupled to their output pin. This paper investigates some basic architectures starting from single stage amplifiers up to a whole operational amplifier. The...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-02-01
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| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/9/2/304 |