A Method for Automated Control of Electronic Components on Microfocus X-ray Images
Introduction. Machine vision systems are increasingly used in industrial production, particularly for monitoring the quality of electronic components. Radiographic (Х-ray) inspection is currently one of the most popular types of non-destructive testing. Electronic components are typically characteri...
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| Format: | Article |
| Language: | Russian |
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Saint Petersburg Electrotechnical University "LETI"
2021-09-01
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| Series: | Известия высших учебных заведений России: Радиоэлектроника |
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| Online Access: | https://re.eltech.ru/jour/article/view/539 |