Application of the E – Layer Model for Solving the Problems of Parametric Estimation in Measuring Devices
The article proposes a technique for estimating the maximum possible errors in measuring the parameters of the signals observed against a background of interference that do not exhibit statistical properties on the measurement interval and of which only the region of their possible change is known....
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2018-01-01
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| Series: | MATEC Web of Conferences |
| Online Access: | https://doi.org/10.1051/matecconf/201815501020 |