Application of the E – Layer Model for Solving the Problems of Parametric Estimation in Measuring Devices
The article proposes a technique for estimating the maximum possible errors in measuring the parameters of the signals observed against a background of interference that do not exhibit statistical properties on the measurement interval and of which only the region of their possible change is known....
| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2018-01-01
|
| Series: | MATEC Web of Conferences |
| Online Access: | https://doi.org/10.1051/matecconf/201815501020 |
| Summary: | The article proposes a technique for estimating the maximum possible errors in measuring the parameters of the signals observed against a background of interference that do not exhibit statistical properties on the measurement interval and of which only the region of their possible change is known. This region is a layer within which the interference-free signal can vary due to the variation in the values of the parameters of the model function describing it. The technique is also proposed that makes it possible to estimate the measurement error of the monitored parameter for a specific implementation of the signal described by the proposed model with a confidence probability close to unity. An example of the use of the offered techniques for estimating the coordinate of a light stain created by a point source is shown. The offered approach is actual, when each measurement represents special worth and there is no possibility to improve the measurement result by averaging over the set of signal realizations. |
|---|---|
| ISSN: | 2261-236X |