Study on Bulk-Surface Transport Separation and Dielectric Polarization of Topological Insulator Bi<sub>1.2</sub>Sb<sub>0.8</sub>Te<sub>0.4</sub>Se<sub>2.6</sub>

Study on Bulk-Surface Transport Separation and Dielectric Polarization of Topological Insulator Bi<sub>1.2</sub>Sb<sub>0.8</sub>Te<sub>0.4</sub>Se<sub>2.6</sub>

This study successfully fabricated the quaternary topological insulator thin films of Bi<sub>1.2</sub>Sb<sub>0.8</sub>Te<sub>0.4</sub>Se<sub>2.6</sub> (BSTS) with a thickness of 25 nm, improving the intrinsic defects in binary topological materials thr...

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Bibliographic Details
Main Authors: Yueqian Zheng, Tao Xu, Xuan Wang, Zhi Sun, Bai Han
Format: Article
Language:English
Published: MDPI AG 2024-02-01
Series:Molecules
Subjects:
nanoscience
topological insulator Bi<sub>1.2</sub>Sb<sub>0.8</sub>Te<sub>0.4</sub>Se<sub>2.6</sub>
transport separation
spectroscopy
Online Access:https://www.mdpi.com/1420-3049/29/4/859

Internet

https://www.mdpi.com/1420-3049/29/4/859

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