A Novel Capacitorless 1T DRAM with Embedded Oxide Layer
A novel vertical dual surrounding gate transistor with embedded oxide layer is proposed for capacitorless single transistor DRAM (1T DRAM). The embedded oxide layer is innovatively used to improve the retention time by reducing the recombination rate of stored holes and sensing electrons. Based on T...
Main Authors: | Dongxue Zhao, Zhiliang Xia, Tao Yang, Yuancheng Yang, Wenxi Zhou, Zongliang Huo |
---|---|
Format: | Article |
Language: | English |
Published: |
MDPI AG
2022-10-01
|
Series: | Micromachines |
Subjects: | |
Online Access: | https://www.mdpi.com/2072-666X/13/10/1772 |
Similar Items
-
Gateless and Capacitorless Germanium Biristor with a Vertical Pillar Structure
by: Hagyoul Bae, et al.
Published: (2021-07-01) -
1T Capacitor-Less DRAM Cell Based on Asymmetric Tunnel FET Design
by: Arnab Biswas, et al.
Published: (2015-01-01) -
The Programming Optimization of Capacitorless 1T DRAM Based on the Dual-Gate TFET
by: Wei Li, et al.
Published: (2017-09-01) -
A New Electron Bridge Channel 1T-DRAM Employing Underlap Region Charge Storage
by: Jyi-Tsong Lin, et al.
Published: (2017-01-01) -
Raised Body Doping-Less 1T-DRAM With Source/Drain Schottky Contact
by: Jyi-Tsong Lin, et al.
Published: (2019-01-01)