Visible-Band Nanosecond Pulsed Laser Damage Thresholds of Silicon 2D Imaging Arrays

Laser-induced camera damage thresholds were measured for several sensors of three different sensor architectures using a Q-switched Nd:YAG laser in order to determine their pulsed laser-induced damage thresholds. Charge coupled device (CCD), front-side illuminated complimentary metal-oxide semicondu...

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Bibliographic Details
Main Authors: Christopher Westgate, David James
Format: Article
Language:English
Published: MDPI AG 2022-03-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/22/7/2526