An investigation into the impacts of deep learning‐based re‐sampling on specific emitter identification performance

Abstract Increasing Internet of Things (IoT) deployments present a growing surface over which villainous actors can carry out attacks. This disturbing revelation is amplified by the fact that most IoT devices use weak or no encryption. Specific Emitter Identification (SEI) is an approach intended to...

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Bibliographic Details
Main Authors: Mohamed K. M. Fadul, Donald R. Reising, Lakmali P. Weerasena
Format: Article
Language:English
Published: Wiley 2023-11-01
Series:The Journal of Engineering
Subjects:
Online Access:https://doi.org/10.1049/tje2.12327