An investigation into the impacts of deep learning‐based re‐sampling on specific emitter identification performance
Abstract Increasing Internet of Things (IoT) deployments present a growing surface over which villainous actors can carry out attacks. This disturbing revelation is amplified by the fact that most IoT devices use weak or no encryption. Specific Emitter Identification (SEI) is an approach intended to...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
Wiley
2023-11-01
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Series: | The Journal of Engineering |
Subjects: | |
Online Access: | https://doi.org/10.1049/tje2.12327 |