An investigation into the impacts of deep learning‐based re‐sampling on specific emitter identification performance

Abstract Increasing Internet of Things (IoT) deployments present a growing surface over which villainous actors can carry out attacks. This disturbing revelation is amplified by the fact that most IoT devices use weak or no encryption. Specific Emitter Identification (SEI) is an approach intended to...

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Main Authors: Mohamed K. M. Fadul, Donald R. Reising, Lakmali P. Weerasena
Format: Article
Language:English
Published: Wiley 2023-11-01
Series:The Journal of Engineering
Subjects:
Online Access:https://doi.org/10.1049/tje2.12327
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author Mohamed K. M. Fadul
Donald R. Reising
Lakmali P. Weerasena
author_facet Mohamed K. M. Fadul
Donald R. Reising
Lakmali P. Weerasena
author_sort Mohamed K. M. Fadul
collection DOAJ
description Abstract Increasing Internet of Things (IoT) deployments present a growing surface over which villainous actors can carry out attacks. This disturbing revelation is amplified by the fact that most IoT devices use weak or no encryption. Specific Emitter Identification (SEI) is an approach intended to address this IoT security weakness. This work provides the first Deep Learning (DL) driven SEI approach that upsamples the signals after collection to improve performance while reducing the hardware requirements of the IoT devices that collect them. DL‐driven upsampling results in superior SEI performance versus two traditional upsampling approaches and a convolutional neural network‐only approach.
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spelling doaj.art-5599a4ba97a44bc8a443055a500e502e2023-11-28T11:02:29ZengWileyThe Journal of Engineering2051-33052023-11-01202311n/an/a10.1049/tje2.12327An investigation into the impacts of deep learning‐based re‐sampling on specific emitter identification performanceMohamed K. M. Fadul0Donald R. Reising1Lakmali P. Weerasena2Electrical Engineering Department University of Tennessee at Chattanooga Chattanooga Tennessee USAElectrical Engineering Department University of Tennessee at Chattanooga Chattanooga Tennessee USADepartment of Mathematics University of Tennessee at Chattanooga Chattanooga Tennessee USAAbstract Increasing Internet of Things (IoT) deployments present a growing surface over which villainous actors can carry out attacks. This disturbing revelation is amplified by the fact that most IoT devices use weak or no encryption. Specific Emitter Identification (SEI) is an approach intended to address this IoT security weakness. This work provides the first Deep Learning (DL) driven SEI approach that upsamples the signals after collection to improve performance while reducing the hardware requirements of the IoT devices that collect them. DL‐driven upsampling results in superior SEI performance versus two traditional upsampling approaches and a convolutional neural network‐only approach.https://doi.org/10.1049/tje2.12327network securityphysical layer securitywireless communication
spellingShingle Mohamed K. M. Fadul
Donald R. Reising
Lakmali P. Weerasena
An investigation into the impacts of deep learning‐based re‐sampling on specific emitter identification performance
The Journal of Engineering
network security
physical layer security
wireless communication
title An investigation into the impacts of deep learning‐based re‐sampling on specific emitter identification performance
title_full An investigation into the impacts of deep learning‐based re‐sampling on specific emitter identification performance
title_fullStr An investigation into the impacts of deep learning‐based re‐sampling on specific emitter identification performance
title_full_unstemmed An investigation into the impacts of deep learning‐based re‐sampling on specific emitter identification performance
title_short An investigation into the impacts of deep learning‐based re‐sampling on specific emitter identification performance
title_sort investigation into the impacts of deep learning based re sampling on specific emitter identification performance
topic network security
physical layer security
wireless communication
url https://doi.org/10.1049/tje2.12327
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