High-Sensitivity Visualization of Ultrafast Carrier Diffusion by Wide-Field Holographic Microscopy
Ultrafast transient microscopy is a key tool to study the photophysical properties of materials in space and time, but current implementations are limited to ≈1-μm fields of view, offering no statistical information for heterogeneous samples. Recently, we demonstrated wide-field transient imaging ba...
| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
American Association for the Advancement of Science (AAAS)
2023-01-01
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| Series: | Ultrafast Science |
| Online Access: | https://spj.science.org/doi/10.34133/ultrafastscience.0032 |