A Class of Tests for Testing Better Failure Rate at Specific Age Distribution With Randomly Right Censored Data
A device has a better failure rate at specific age t0 property, denoted by BFR-t0 if its failure rate r(t) increases for t≤t0 and for t>t0, r(t) is not less than its value at t0. A test statistic is proposed to test exponentiality versus BFR-t0 based on a randomly right censored sample of size n....
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| Format: | Article |
| Language: | English |
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Etamaths Publishing
2023-08-01
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| Series: | International Journal of Analysis and Applications |
| Online Access: | http://etamaths.com/index.php/ijaa/article/view/2862 |