Fabrication of Small-Pixel CdZnTe Sensors and Characterization with X-rays

Fabrication of Small-Pixel CdZnTe Sensors and Characterization with X-rays

Over the past few years, sensors made from high-Z compound semiconductors have attracted quite some attention for use in applications which require the direct detection of X-rays in the energy range 30–100 keV. One of the candidate materials with promising properties is cadmium zinc telluride (CdZnT...

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Bibliographic Details
Main Authors: Stergios Tsigaridas, Silvia Zanettini, Manuele Bettelli, Nicola Sarzi Amadè, Davide Calestani, Cyril Ponchut, Andrea Zappettini
Format: Article
Language:English
Published: MDPI AG 2021-04-01
Series:Sensors
Subjects:
cadmium zinc telluride (CdZnTe)
vertical Bridgman
high-Z sensors
pixel detectors
X-ray detectors
Timepix
Online Access:https://www.mdpi.com/1424-8220/21/9/2932

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https://www.mdpi.com/1424-8220/21/9/2932

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