Using Enhanced Test Systems Based on Digital IC Test Model for the Improvement of Test Yield

Using Enhanced Test Systems Based on Digital IC Test Model for the Improvement of Test Yield

In this work, we use statistical concepts to evaluate the joint probability distribution of manufacturing and test parameters and estimate the future trend of wafer test yield. Owing to the difference between the development speeds of testing technology and manufacturing technology, the testing capa...

Full description

Bibliographic Details
Main Authors: Chung-Huang Yeh, Jwu-E Chen, Chia-Jui Chang, Tse-Chia Huang
Format: Article
Language:English
Published: MDPI AG 2022-03-01
Series:Electronics
Subjects:
guardband test
threshold test
test quality
defect level
manufacturing yield
Online Access:https://www.mdpi.com/2079-9292/11/7/1115

Internet

https://www.mdpi.com/2079-9292/11/7/1115

Similar Items