Crystal Growth and Characterization of ZrSiS-Type Topological Dirac Semimetals

Crystal Growth and Characterization of ZrSiS-Type Topological Dirac Semimetals

WHM materials (W = Zr/Hf, H = Si/Ge/Sn, M = S/Se/Te) represent a large family of topological semimetals, which have attracted intensive interest since they are considered to be good candidates for studying various topological states. Here, we report the crystal growth, characterization, and electron...

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Bibliographic Details
Main Authors: Ying Yang, Peng Zhu, Liu Yang, Jinjin Liu, Yongkai Li, Zhiwei Wang
Format: Article
Language:English
Published: MDPI AG 2022-05-01
Series:Crystals
Subjects:
Dirac semimetal
crystal growth
electronic properties
X-ray diffraction
Online Access:https://www.mdpi.com/2073-4352/12/5/728

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https://www.mdpi.com/2073-4352/12/5/728

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