Crystal Growth and Characterization of ZrSiS-Type Topological Dirac Semimetals

WHM materials (W = Zr/Hf, H = Si/Ge/Sn, M = S/Se/Te) represent a large family of topological semimetals, which have attracted intensive interest since they are considered to be good candidates for studying various topological states. Here, we report the crystal growth, characterization, and electron...

Повний опис

Бібліографічні деталі
Автори: Ying Yang, Peng Zhu, Liu Yang, Jinjin Liu, Yongkai Li, Zhiwei Wang
Формат: Стаття
Мова:English
Опубліковано: MDPI AG 2022-05-01
Серія:Crystals
Предмети:
Онлайн доступ:https://www.mdpi.com/2073-4352/12/5/728