A Survey of GaN HEMT Technologies for Millimeter-Wave Low Noise Applications

A Survey of GaN HEMT Technologies for Millimeter-Wave Low Noise Applications

This article presents a set of measured benchmarks for the noise and gain performance of six different millimeter-wave (mm-wave) gallium nitride (GaN) high electron mobility transistor (HEMT) technologies fabricated at four different foundries in the United States. Measurements of the GaN transistor...

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Bibliographic Details
Main Authors: Nicholas C. Miller, Andrea Arias-Purdue, Erdem Arkun, David Brown, James F. Buckwalter, Robert L. Coffie, Andrea Corrion, Daniel J. Denninghoff, Michael Elliott, Dave Fanning, Ryan Gilbert, Daniel S. Green, Florian Herrault, Ben Heying, Casey M. King, Eythan Lam, Jeong-Sun Moon, Petra V. Rowell, Georges Siddiqi, Ioulia Smorchkova, Joe Tai, Jansen Uyeda, Mike Wojtowicz
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Journal of Microwaves
Subjects:
Gallium nitride (GaN)
high electron mobility transistor (HEMT)
noise parameters
low noise amplifier
Online Access:https://ieeexplore.ieee.org/document/10260709/

Internet

https://ieeexplore.ieee.org/document/10260709/

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