DFT based estimation of CNT parameters and simulation-study of GAA CNTFET for nano scale applications
The device dimensions have been consistently scaling down since many developing technologies need smaller and faster integrated circuits for advancement and improvement in both performance and device density. Device dimensions have been decreased drastically from micron to sub nanometer regime. Trad...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2020-01-01
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| Series: | Materials Research Express |
| Subjects: | |
| Online Access: | https://doi.org/10.1088/2053-1591/ab6924 |