CMOS Fixed Pattern Noise Removal Based on Low Rank Sparse Variational Method
Fixed pattern noise (FPN) has always been an important factor affecting the imaging quality of CMOS image sensor (CIS). However, the current scene-based FPN removal methods mostly focus on the image itself, and seldom consider the structure information of the FPN, resulting in various undesirable no...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-05-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/10/11/3694 |