Wavelet transform-based characterization of printing ink penetration depth and image phase dissimilarity

In this paper, continuous wavelet transform and discrete wavelet transform are used to detect transient anomalies entrained in normal information and to demonstrate their components. Multi-scale analysis of wavelet transform, Haar wavelet basis and multi-scale edge detection algorithms are utilized...

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Bibliographic Details
Main Authors: Liu Haiyan, Fan Lina, Shi Wenjun, Zhou Jiajun
Format: Article
Language:English
Published: Sciendo 2024-01-01
Series:Applied Mathematics and Nonlinear Sciences
Subjects:
Online Access:https://doi.org/10.2478/amns.2023.2.01416