A Novel General Compact Model Approach for 7-nm Technology Node Circuit Optimization From Device Perspective and Beyond

A Novel General Compact Model Approach for 7-nm Technology Node Circuit Optimization From Device Perspective and Beyond

This work presents a novel general compact model for 7-nm technology node devices like FinFETs as an extension of previous conventional compact model that based on some less accurate elements including one-dimensional Poisson equation for three-dimensional devices and analytical equations for short...

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Bibliographic Details
Main Authors: Qiang Huo, Zhenhua Wu, Weixing Huang, Xingsheng Wang, Geyu Tang, Jiaxin Yao, Yongpan Liu, Xiaojin Zhao, Feng Zhang, Ling Li, Ming Liu
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
General compact model
FinFET
ESD power clamp
7-nm technology node and beyond
Online Access:https://ieeexplore.ieee.org/document/9034086/

Internet

https://ieeexplore.ieee.org/document/9034086/

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