Temperature dependence of the band gap of ^{28}Si:P at very low temperatures measured via time-resolved optical spectroscopy

We measure the temperature dependence of the indirect band gap of isotopically purified ^{28}Si:P in the regime from 0.1 K to 3 K by high-resolution absorption spectroscopy of the donor bound exciton transition. The measurements increase the up-to-date precision of the temperature-dependent band gap...

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Bibliographic Details
Main Authors: E. Sauter, N. V. Abrosimov, J. Hübner, M. Oestreich
Format: Article
Language:English
Published: American Physical Society 2023-03-01
Series:Physical Review Research
Online Access:http://doi.org/10.1103/PhysRevResearch.5.013182
Description
Summary:We measure the temperature dependence of the indirect band gap of isotopically purified ^{28}Si:P in the regime from 0.1 K to 3 K by high-resolution absorption spectroscopy of the donor bound exciton transition. The measurements increase the up-to-date precision of the temperature-dependent band gap change by more than one order of magnitude and reveal a T^{4} dependence which is about a factor of two less than observed in previous measurements. Such a T^{4} dependence is predicted by theory, but the absolute values differ between our experiment and the most up-to-date calculations by a factor of 30, corroborating that the electron-phonon interaction at low temperatures is still not correctly included into theory. What is more, the ability of such very high-precision band-gap measurements facilitates the use of time- and spatially resolved ^{28}Si:P absorption as a contactless, local thermometer and electric field sensor with a demonstrated time resolution of milliseconds.
ISSN:2643-1564