MBMF: Constructing memory banks of multi‐scale features for anomaly detection
Abstract In industrial manufacturing, how to accurately classify defective products and locate the location of defects has always been a concern. Previous studies mainly measured similarity based on extracting single‐scale features of samples. However, only using the features of a single scale is ha...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2024-04-01
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| Series: | IET Computer Vision |
| Subjects: | |
| Online Access: | https://doi.org/10.1049/cvi2.12258 |