Role of Edge Inclination in an Optical Microdisk Resonator for Label-Free Sensing

In this paper, we report on the measurement and modeling of enhanced optical refractometric sensors based on whispering gallery modes. The devices under test are optical microresonators made of silicon nitride on silicon oxide, which differ in their sidewall inclination angle. In our approach, these...

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Bibliographic Details
Main Authors: Davide Gandolfi, Fernando Ramiro-Manzano, Francisco Javier Aparicio Rebollo, Mher Ghulinyan, Georg Pucker, Lorenzo Pavesi
Format: Article
Language:English
Published: MDPI AG 2015-02-01
Series:Sensors
Subjects:
Online Access:http://www.mdpi.com/1424-8220/15/3/4796