Genome-Wide Association Analysis of Stable Stripe Rust Resistance Loci in a Chinese Wheat Landrace Panel Using the 660K SNP Array

Genome-Wide Association Analysis of Stable Stripe Rust Resistance Loci in a Chinese Wheat Landrace Panel Using the 660K SNP Array

Stripe rust (caused by Puccinia striiformis f. sp. tritici) is one of the most severe diseases affecting wheat production. The disease is best controlled by developing and growing resistant cultivars. Chinese wheat (Triticum aestivum) landraces have excellent resistance to stripe rust. The objective...

Full description

Bibliographic Details
Main Authors: Fangjie Yao, Fangnian Guan, Luyao Duan, Li Long, Hao Tang, Yunfeng Jiang, Hao Li, Qiantao Jiang, Jirui Wang, Pengfei Qi, Houyang Kang, Wei Li, Jian Ma, Zhien Pu, Mei Deng, Yuming Wei, Youliang Zheng, Xianming Chen, Guoyue Chen
Format: Article
Language:English
Published: Frontiers Media S.A. 2021-12-01
Series:Frontiers in Plant Science
Subjects:
wheat landraces
resistance
stripe rust
GWAS
KASP markers
Online Access:https://www.frontiersin.org/articles/10.3389/fpls.2021.783830/full

Internet

https://www.frontiersin.org/articles/10.3389/fpls.2021.783830/full

Similar Items