Current tuned slotted Y‐branch laser for wafer thickness measurements with THz radiation

Current tuned slotted Y‐branch laser for wafer thickness measurements with THz radiation

Abstract A slotted Y‐branch laser diode that emits two spectral modes at a difference frequency of about 1 THz is investigated in the context of photonic based cw‐THz measurements. The beating frequency of the emitted laser light can be tuned by ±10.5 GHz around 1 THz by changing the applied laser c...

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Bibliographic Details
Main Authors: N. Surkamp, A. Gerling, J. O'Gorman, M. Honsberg, S. Schmidtmann, U. Nandi, S. Preu, J. Sacher, C. Brenner, M. R. Hofmann
Format: Article
Language:English
Published: Wiley 2021-11-01
Series:Electronics Letters
Subjects:
Spatial variables measurement
Lasing action in semiconductors
Design of specific laser systems
Laser beam modulation, pulsing and switching; mode locking and tuning
Metrological applications of lasers
Microwave photonics
Online Access:https://doi.org/10.1049/ell2.12314

Internet

https://doi.org/10.1049/ell2.12314

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