Review on the Application of X-ray Diffraction in Gem Identification, Synthesis and Crystal Structure Research

Review on the Application of X-ray Diffraction in Gem Identification, Synthesis and Crystal Structure Research

Due to the nondestructive requirements of gem testing, evaluation of precious stones shows characteristics of science and uncertainty. Gemological application of X-ray Diffraction (XRD) is specialized, with its application mainly concentrated in three aspects:① Gemstone identification:phase identifi...

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Bibliographic Details
Main Authors: ZHANG Ni, LIN Chun-ming
Format: Article
Language:English
Published: Science Press, PR China 2016-06-01
Series:Yankuang ceshi
Subjects:
x-ray diffraction
gem identification
gem synthesis
crystal structure of gem mineral
technology of gemological research
Online Access:http://www.ykcs.ac.cn/en/article/doi/10.15898/j.cnki.11-2131/td.2016.03.002

Internet

http://www.ykcs.ac.cn/en/article/doi/10.15898/j.cnki.11-2131/td.2016.03.002

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