Simulation Study of Sputtering Yield of Zn Target Bombarded By Xenon Ions

    Using a reduction of TRIM simulation data, the sputtering yield behaviour of Zinc target bombard by heavy Xenon ions plasma is studied. The sputtering yield as a function of Zinc layer width, Xenon ion number, energy of ions, and the angle of ion incidence are calculated and illustrated graphic...

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Bibliographic Details
Main Authors: Samira A. Ebrahiem, Firas M. Hady, Mustafa K. Jassim, Huda M. Tawfeek
Format: Article
Language:English
Published: University of Baghdad 2017-03-01
Series:Ibn Al-Haitham Journal for Pure and Applied Sciences
Subjects:
Online Access:https://jih.uobaghdad.edu.iq/index.php/j/article/view/89