Indirect Thermographic Temperature Measurement of a Power-Rectifying Diode Die

Indirect Thermographic Temperature Measurement of a Power-Rectifying Diode Die

This article concerns the indirect thermographic temperature measurement of a die of the semiconductor diode D00-250-10. The article shows how the goal was achieved. The methodology of selecting the point at which thermographic measurements of the temperature of the diode cases were performed is dis...

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Bibliographic Details
Main Authors: Krzysztof Dziarski, Arkadiusz Hulewicz, Grzegorz Dombek, Łukasz Drużyński
Format: Article
Language:English
Published: MDPI AG 2022-04-01
Series:Energies
Subjects:
thermography
indirect thermographic measurement
rectifying diode
thermal modeling
emissivity coefficient
convection coefficient
Online Access:https://www.mdpi.com/1996-1073/15/9/3203

Internet

https://www.mdpi.com/1996-1073/15/9/3203

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