Drift Artifacts Correction for Laboratory Cone-Beam Nanoscale X-ray Computed Tomography by Fitting the Partial Trajectory of Projection Centroid
A self-correction method for the drift artifacts of laboratory cone-beam nanoscale X-ray computed tomography (nano-CT) based on the trajectory of projection centroid (TPC) is proposed. This method does not require additional correction phantoms, simplifying the correction process. The whole TPC is e...
| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2022-06-01
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| Series: | Photonics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2304-6732/9/6/405 |