Elemental Analysis of Lapis Lazuli sample, using complementary techniques of IBIL and MicroPIXE

Ion Beam Induced Luminescence (IBIL) is a useful IBA technique which could be utilized to obtain information about the nature of chemical bonds in materials. Regarding the probed area, this non-destructive and fast technique is a suitable complementary one for MicroPIXE. Since most minerals are lumi...

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Bibliographic Details
Main Authors: T Nikbakht, O R Kakuee, M Lamehi Rachti, M Sedaghati Boorkhani
Format: Article
Language:English
Published: Isfahan University of Technology 2015-07-01
Series:Iranian Journal of Physics Research
Subjects:
Online Access:http://ijpr.iut.ac.ir/browse.php?a_code=A-10-1-692&slc_lang=en&sid=1