Elemental Analysis of Lapis Lazuli sample, using complementary techniques of IBIL and MicroPIXE
Ion Beam Induced Luminescence (IBIL) is a useful IBA technique which could be utilized to obtain information about the nature of chemical bonds in materials. Regarding the probed area, this non-destructive and fast technique is a suitable complementary one for MicroPIXE. Since most minerals are lumi...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Isfahan University of Technology
2015-07-01
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| Series: | Iranian Journal of Physics Research |
| Subjects: | |
| Online Access: | http://ijpr.iut.ac.ir/browse.php?a_code=A-10-1-692&slc_lang=en&sid=1 |
| _version_ | 1818841251267477504 |
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| author | T Nikbakht O R Kakuee M Lamehi Rachti M Sedaghati Boorkhani |
| author_facet | T Nikbakht O R Kakuee M Lamehi Rachti M Sedaghati Boorkhani |
| author_sort | T Nikbakht |
| collection | DOAJ |
| description | Ion Beam Induced Luminescence (IBIL) is a useful IBA technique which could be utilized to obtain information about the nature of chemical bonds in materials. Regarding the probed area, this non-destructive and fast technique is a suitable complementary one for MicroPIXE. Since most minerals are luminescent, IBIL is an applicable analytical technique in mineralogy. In this research work, to characterize a Lapis lazuli sample, a 2.7 MeV proton beam is utilized. After data collection and analysis of the results obtained from both techniques of IBIL and MicroPIXE, elemental maps of the sample were developed. Comparison of the results with other available ones in the literature indicates the capability and accuracy of the combination of the two complementary techniques for characterization of minerals as well as precious historical objects |
| first_indexed | 2024-12-19T04:23:06Z |
| format | Article |
| id | doaj.art-5b390cdfe2a942b3849782ae16991f20 |
| institution | Directory Open Access Journal |
| issn | 1682-6957 |
| language | English |
| last_indexed | 2024-12-19T04:23:06Z |
| publishDate | 2015-07-01 |
| publisher | Isfahan University of Technology |
| record_format | Article |
| series | Iranian Journal of Physics Research |
| spelling | doaj.art-5b390cdfe2a942b3849782ae16991f202022-12-21T20:36:06ZengIsfahan University of TechnologyIranian Journal of Physics Research1682-69572015-07-01151917Elemental Analysis of Lapis Lazuli sample, using complementary techniques of IBIL and MicroPIXET Nikbakht0O R Kakuee1M Lamehi Rachti2M Sedaghati Boorkhani3 Physics and Accelerators Research School, Nuclear Science & Technology Research Institute (NSTRI), Tehran, Iran Physics and Accelerators Research School, Nuclear Science & Technology Research Institute (NSTRI), Tehran, Iran Physics and Accelerators Research School, Nuclear Science & Technology Research Institute (NSTRI), Tehran, Iran Physics and Accelerators Research School, Nuclear Science & Technology Research Institute (NSTRI), Tehran, Iran Ion Beam Induced Luminescence (IBIL) is a useful IBA technique which could be utilized to obtain information about the nature of chemical bonds in materials. Regarding the probed area, this non-destructive and fast technique is a suitable complementary one for MicroPIXE. Since most minerals are luminescent, IBIL is an applicable analytical technique in mineralogy. In this research work, to characterize a Lapis lazuli sample, a 2.7 MeV proton beam is utilized. After data collection and analysis of the results obtained from both techniques of IBIL and MicroPIXE, elemental maps of the sample were developed. Comparison of the results with other available ones in the literature indicates the capability and accuracy of the combination of the two complementary techniques for characterization of minerals as well as precious historical objectshttp://ijpr.iut.ac.ir/browse.php?a_code=A-10-1-692&slc_lang=en&sid=1ion beam induced luminescence microPIXE chemical imaging Lapis Lazuli |
| spellingShingle | T Nikbakht O R Kakuee M Lamehi Rachti M Sedaghati Boorkhani Elemental Analysis of Lapis Lazuli sample, using complementary techniques of IBIL and MicroPIXE Iranian Journal of Physics Research ion beam induced luminescence microPIXE chemical imaging Lapis Lazuli |
| title | Elemental Analysis of Lapis Lazuli sample, using complementary techniques of IBIL and MicroPIXE |
| title_full | Elemental Analysis of Lapis Lazuli sample, using complementary techniques of IBIL and MicroPIXE |
| title_fullStr | Elemental Analysis of Lapis Lazuli sample, using complementary techniques of IBIL and MicroPIXE |
| title_full_unstemmed | Elemental Analysis of Lapis Lazuli sample, using complementary techniques of IBIL and MicroPIXE |
| title_short | Elemental Analysis of Lapis Lazuli sample, using complementary techniques of IBIL and MicroPIXE |
| title_sort | elemental analysis of lapis lazuli sample using complementary techniques of ibil and micropixe |
| topic | ion beam induced luminescence microPIXE chemical imaging Lapis Lazuli |
| url | http://ijpr.iut.ac.ir/browse.php?a_code=A-10-1-692&slc_lang=en&sid=1 |
| work_keys_str_mv | AT tnikbakht elementalanalysisoflapislazulisampleusingcomplementarytechniquesofibilandmicropixe AT orkakuee elementalanalysisoflapislazulisampleusingcomplementarytechniquesofibilandmicropixe AT mlamehirachti elementalanalysisoflapislazulisampleusingcomplementarytechniquesofibilandmicropixe AT msedaghatiboorkhani elementalanalysisoflapislazulisampleusingcomplementarytechniquesofibilandmicropixe |