Correction of phase drifts in two-wavelength digital holographic microscopy using secondary reference waves
We present a two-wavelength digital holographic microscopy setup for surface topography measurement with single-point illumination and a method for correction of unwanted phase drifts using secondary reference waves.
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2024-01-01
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| Series: | EPJ Web of Conferences |
| Online Access: | https://www.epj-conferences.org/articles/epjconf/pdf/2024/19/epjconf_eosam2024_02006.pdf |