Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratories
Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a localized area of a solid target by performing mass spectrometry on secondary ions sputtered from its surface by the impact of a beam of charged particles. This primary beam sputters ionized atoms a...
| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | deu |
| Published: |
Swiss Chemical Society
2022-02-01
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| Series: | CHIMIA |
| Subjects: | |
| Online Access: | https://www.chimia.ch/chimia/article/view/698 |
| _version_ | 1811335729735794688 |
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| author | Johanna Marin Carbonne Andras Kiss Anne-Sophie Bouvier Anders Meibom Lukas Baumgartner Thomas Bovay Florent Plane Stephane Escrig Daniela Rubatto |
| author_facet | Johanna Marin Carbonne Andras Kiss Anne-Sophie Bouvier Anders Meibom Lukas Baumgartner Thomas Bovay Florent Plane Stephane Escrig Daniela Rubatto |
| author_sort | Johanna Marin Carbonne |
| collection | DOAJ |
| description |
Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a localized area of a solid target by performing mass spectrometry on secondary ions sputtered from its surface by the impact of a beam of charged particles. This primary beam sputters ionized atoms and small molecules (as well as many neutral particles) from the upper few nanometers of the sample surface. The physical basis of SIMS has been applied to a large range of applications utilizing instruments optimized with different types of mass analyzer, either dynamic SIMS with a double focusing mass spectrometer or static SIMS with a Time of Flight (TOF) analyzer. Here, we present a short review of the principles and major applications of three different SIMS instruments located in Switzerland.
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| first_indexed | 2024-04-13T17:29:28Z |
| format | Article |
| id | doaj.art-5b5304f539464e8493d04ef2e555681b |
| institution | Directory Open Access Journal |
| issn | 0009-4293 2673-2424 |
| language | deu |
| last_indexed | 2024-04-13T17:29:28Z |
| publishDate | 2022-02-01 |
| publisher | Swiss Chemical Society |
| record_format | Article |
| series | CHIMIA |
| spelling | doaj.art-5b5304f539464e8493d04ef2e555681b2022-12-22T02:37:37ZdeuSwiss Chemical SocietyCHIMIA0009-42932673-24242022-02-01761-210.2533/chimia.2022.26Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratories Johanna Marin Carbonne0Andras Kiss1Anne-Sophie Bouvier2Anders Meibom3Lukas Baumgartner4Thomas Bovay5Florent Plane6Stephane Escrig7Daniela Rubatto8UNILUniversity of GenevaUNILUNIL, EPFLUNILUNILUNIL, EPFLEPFLUniversity of Bern Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a localized area of a solid target by performing mass spectrometry on secondary ions sputtered from its surface by the impact of a beam of charged particles. This primary beam sputters ionized atoms and small molecules (as well as many neutral particles) from the upper few nanometers of the sample surface. The physical basis of SIMS has been applied to a large range of applications utilizing instruments optimized with different types of mass analyzer, either dynamic SIMS with a double focusing mass spectrometer or static SIMS with a Time of Flight (TOF) analyzer. Here, we present a short review of the principles and major applications of three different SIMS instruments located in Switzerland. https://www.chimia.ch/chimia/article/view/698SIMSTOF SIMSNanoSIMSEarth SciencesMaterial SciencesBiology |
| spellingShingle | Johanna Marin Carbonne Andras Kiss Anne-Sophie Bouvier Anders Meibom Lukas Baumgartner Thomas Bovay Florent Plane Stephane Escrig Daniela Rubatto Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratories CHIMIA SIMS TOF SIMS NanoSIMS Earth Sciences Material Sciences Biology |
| title | Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratories |
| title_full | Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratories |
| title_fullStr | Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratories |
| title_full_unstemmed | Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratories |
| title_short | Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratories |
| title_sort | surface analysis by secondary ion mass spectrometry sims principles and applications from swiss laboratories |
| topic | SIMS TOF SIMS NanoSIMS Earth Sciences Material Sciences Biology |
| url | https://www.chimia.ch/chimia/article/view/698 |
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