Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratories

Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratories

Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a localized area of a solid target by performing mass spectrometry on secondary ions sputtered from its surface by the impact of a beam of charged particles. This primary beam sputters ionized atoms a...

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Bibliographic Details
Main Authors: Johanna Marin Carbonne, Andras Kiss, Anne-Sophie Bouvier, Anders Meibom, Lukas Baumgartner, Thomas Bovay, Florent Plane, Stephane Escrig, Daniela Rubatto
Format: Article
Language:deu
Published: Swiss Chemical Society 2022-02-01
Series:CHIMIA
Subjects:
SIMS
TOF SIMS
NanoSIMS
Earth Sciences
Material Sciences
Biology
Online Access:https://www.chimia.ch/chimia/article/view/698

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